发明申请
- 专利标题: X-ray inspection system having on-axis and off-axis sensors
- 专利标题(中): 具有轴上和离轴传感器的X射线检测系统
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申请号: US11145073申请日: 2005-06-02
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公开(公告)号: US20060274883A1公开(公告)日: 2006-12-07
- 发明人: Dean Buck , Tracy Eliasson , Anthony Turner , Ronald Kerschner
- 申请人: Dean Buck , Tracy Eliasson , Anthony Turner , Ronald Kerschner
- 主分类号: G01N23/04
- IPC分类号: G01N23/04
摘要:
An x-ray inspection system. The x-ray inspection system includes an x-ray source, an on-axis x-ray sensor, at least one off-axis x-ray sensor, a fixture, and an accumulation circuit. The on-axis x-ray sensor is configured to capture on-axis images of radiation from the x-ray source. The x-ray source is displaced from the on-axis x-ray sensor, and the x-ray source and the on-axis x-ray sensor are positioned on an axis conceptually drawn between the x-ray source and the on-axis x-ray sensor. At least one off-axis x-ray sensor is configured to capture off-axis images of radiation from the x-ray source, wherein each off-axis x-ray sensor is positioned off the axis. The fixture is configured to maintain an article between the x-ray source and the on-axis and off-axis x-ray sensors, and the accumulation circuit is configured to receive and accumulate images captured by the on-axis and off-axis x-ray sensors.
公开/授权文献
- US07245693B2 X-ray inspection system having on-axis and off-axis sensors 公开/授权日:2007-07-17
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