发明申请
US20060289734A1 Increased depth of field for high resolution imaging for a matrix-based ion source 有权
增加基于矩阵的离子源高分辨率成像的景深

  • 专利标题: Increased depth of field for high resolution imaging for a matrix-based ion source
  • 专利标题(中): 增加基于矩阵的离子源高分辨率成像的景深
  • 申请号: US11168612
    申请日: 2005-06-27
  • 公开(公告)号: US20060289734A1
    公开(公告)日: 2006-12-28
  • 发明人: Jean-Luc TrucheGregor Overney
  • 申请人: Jean-Luc TrucheGregor Overney
  • 主分类号: H01J49/10
  • IPC分类号: H01J49/10
Increased depth of field for high resolution imaging for a matrix-based ion source
摘要:
The invention provides a method of producing an in-focus image of an area on a sample plate for an ion source, e.g., a matrix-based ion source or any other type of ion source that employs a sample plate onto which samples are deposited. The method generally includes: a) positioning an area of the sample plate in the field of view of an imaging device; b) producing a plurality of images of the area having different in-focus regions; and c) generating an in-focus image of the area using the plurality of images. The in-focus image may be two-dimensional or three-dimensional. Systems and programming for performing the methods are also provided.
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