Method and apparatus for surface desorption ionization by charged particles
    1.
    发明授权
    Method and apparatus for surface desorption ionization by charged particles 有权
    带电粒子表面解吸电离的方法和装置

    公开(公告)号:US08129677B2

    公开(公告)日:2012-03-06

    申请号:US12753786

    申请日:2010-04-02

    IPC分类号: H01J49/26

    CPC分类号: H01J49/142

    摘要: An apparatus and method for generating analyte ions from a sample. An ion generating device is provided having a chamber with an outlet and a surface having a material and means for applying a high velocity gas flow through the chamber toward the outlet such that charged particles are produced by physical interaction between the high velocity gas and the material. The charged particles then induce the generation of primary ions by interaction with molecules of the high velocity gas. The primary ions are emitted from the outlet of the ion generating device toward a sample-bearing surface and analyte ions are generated by impact of the primary ions on the analyte sample on the surface.

    摘要翻译: 一种用于从样品中产生分析物离子的装置和方法。 提供一种离子产生装置,其具有具有出口的腔室和具有材料的表面,以及用于将高速气流经由腔室朝向出口施加的装置,使得通过高速气体和材料之间的物理相互作用产生带电粒子 。 带电粒子然后通过与高速气体分子的相互作用诱导产生初级离子。 主要离子从离子产生装置的出口朝向样品承载表面发射,分析物离子通过主离子冲击表面上的分析物样品而产生。

    Apparatus and method for ion production enhancement
    2.
    发明授权
    Apparatus and method for ion production enhancement 有权
    用于离子生产增强的装置和方法

    公开(公告)号:US07372043B2

    公开(公告)日:2008-05-13

    申请号:US11155070

    申请日:2005-06-16

    IPC分类号: H01J27/00

    摘要: The invention described herein provides a matrix-based ion source including a gas heating device for providing heated gas at a defined temperature to the ionization region of the ion source. The ion source may also include a temperature sensor. The heating device and temperature sensor may be operably connected to work as a closed feedback loop to provide gas at a constant, pre-determined, temperature to the ionization region. Also disclosed is a mass spectrometer system having the matrix-based ion source. A method of producing ions employing gas that is heated to a pre-determined temperature is also provided.

    摘要翻译: 本文描述的本发明提供了一种基于矩阵的离子源,其包括用于在限定的温度下向离子源的电离区域提供加热气体的气体加热装置。 离子源还可以包括温度传感器。 加热装置和温度传感器可以可操作地连接以作为闭合反馈回路工作,以将恒定的预定温度的气体提供给电离区域。 还公开了具有基于基质的离子源的质谱仪系统。 还提供了使用被加热到预定温度的气体产生离子的方法。

    Increased depth of field for high resolution imaging for a matrix-based ion source
    3.
    发明授权
    Increased depth of field for high resolution imaging for a matrix-based ion source 有权
    增加基于矩阵的离子源高分辨率成像的景深

    公开(公告)号:US07365310B2

    公开(公告)日:2008-04-29

    申请号:US11168612

    申请日:2005-06-27

    IPC分类号: H01J49/10

    摘要: The invention provides a method of producing an in-focus image of an area on a sample plate for an ion source, e.g., a matrix-based ion source or any other type of ion source that employs a sample plate onto which samples are deposited. The method generally includes: a) positioning an area of the sample plate in the field of view of an imaging device; b) producing a plurality of images of the area having different in-focus regions; and c) generating an in-focus image of the area using the plurality of images. The in-focus image may be two-dimensional or three-dimensional. Systems and programming for performing the methods are also provided.

    摘要翻译: 本发明提供一种制造用于离子源的样品板(例如基于矩阵的离子源或使用其上沉积样品的样品板的任何其它类型的离子源)的区域的对焦图像的方法。 该方法通常包括:a)将样品板的区域定位在成像装置的视野内; b)产生具有不同对焦区域的区域的多个图像; 以及c)使用所述多个图像生成所述区域的对焦图像。 对焦图像可以是二维或三维的。 还提供了用于执行方法的系统和编程。

    Apparatus and method for ion production enhancement

    公开(公告)号:US07135689B2

    公开(公告)日:2006-11-14

    申请号:US11041118

    申请日:2005-01-21

    IPC分类号: H01J27/00

    CPC分类号: H01J49/164 H01J49/0477

    摘要: The present invention relates to an apparatus and method for use with a mass spectrometer. The ion enhancement system of the present invention is used to direct a heated gas toward ions produced by a matrix based ion source and detected by a detector. The ion enhancement system is interposed between the ion source and the detector. The analyte ions that contact the heated gas are enhanced and an increased number of ions are more easily detected by a detector. The method of the invention comprises producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the enhanced analyte ions with a detector.

    Laser alignment for ion source
    5.
    发明申请
    Laser alignment for ion source 有权
    离子源的激光对准

    公开(公告)号:US20060207115A1

    公开(公告)日:2006-09-21

    申请号:US11083236

    申请日:2005-03-17

    IPC分类号: G01C15/00

    摘要: An apparatus and method for aligning a laser beam in an ion source. A mounting member has a first end, a second end, and an axis. An awl is positioned on the axis and operably connected to the first end. A biasing member is arranged to urge the awl along the axis when the apparatus is mounted on the ion source to create a mark for aligning the laser beam.

    摘要翻译: 用于对准离子源中的激光束的装置和方法。 安装构件具有第一端,第二端和轴。 锥体位于轴上并且可操作地连接到第一端。 偏置构件布置成当装置安装在离子源上时沿着轴推动锥形以产生用于对准激光束的标记。

    Apparatus and method for ion production enhancement

    公开(公告)号:US20050161613A1

    公开(公告)日:2005-07-28

    申请号:US11041118

    申请日:2005-01-21

    IPC分类号: H01J49/04 H01J49/16 H01J27/00

    CPC分类号: H01J49/164 H01J49/0477

    摘要: The present invention relates to an apparatus and method for use with a mass spectrometer. The ion enhancement system of the present invention is used to direct a heated gas toward ions produced by a matrix based ion source and detected by a detector. The ion enhancement system is interposed between the ion source and the detector. The analyte ions that contact the heated gas are enhanced and an increased number of ions are more easily detected by a detector. The method of the invention comprises producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the enhanced analyte ions with a detector.

    Apparatus and method for ion production enhancement

    公开(公告)号:US20050077464A1

    公开(公告)日:2005-04-14

    申请号:US10966454

    申请日:2004-10-15

    IPC分类号: H01J49/04 H01J49/16 H01J49/00

    CPC分类号: H01J49/164 H01J49/0477

    摘要: The present invention relates to an apparatus and method for use with a mass spectrometer. The ion enhancement system of the present invention is used to direct a heated gas toward ions produced by a matrix based ion source and detected by a detector. The ion enhancement system is interposed between the ion source and the detector. The analyte ions that contact the heated gas are enhanced and an increased number of ions are more easily detected by a detector. The method of the invention comprises producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the enhanced analyte ions with a detector.

    Method and apparatus for surface desorption ionization by charged particles
    9.
    发明授权
    Method and apparatus for surface desorption ionization by charged particles 有权
    带电粒子表面解吸电离的方法和装置

    公开(公告)号:US07723678B2

    公开(公告)日:2010-05-25

    申请号:US11398305

    申请日:2006-04-04

    IPC分类号: H01J49/14

    CPC分类号: H01J49/142

    摘要: An apparatus and method for generating analyte ions from a sample. An ion generating device is provided having a chamber with an outlet and a surface having a material and means for applying a high velocity gas flow through the chamber toward the outlet such that charged particles are produced by physical interaction between the high velocity gas and the material. The charged particles then induce the generation of primary ions by interaction with molecules of the high velocity gas. The primary ions are emitted from the outlet of the ion generating device toward a sample-bearing surface and analyte ions are generated by impact of the primary ions on the analyte sample on the surface.

    摘要翻译: 一种用于从样品中产生分析物离子的装置和方法。 提供一种离子产生装置,其具有具有出口的腔室和具有材料的表面,以及用于将高速气流经由腔室朝向出口施加的装置,使得通过高速气体和材料之间的物理相互作用产生带电粒子 。 带电粒子然后通过与高速气体分子的相互作用诱导产生初级离子。 主要离子从离子产生装置的出口朝向样品承载表面发射,分析物离子通过主离子冲击表面上的分析物样品而产生。