- 专利标题: Inspection system with material identification
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申请号: US11453545申请日: 2006-06-14
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公开(公告)号: US20060291622A1公开(公告)日: 2006-12-28
- 发明人: Richard Smith , Robert Madden , James Connelly
- 申请人: Richard Smith , Robert Madden , James Connelly
- 申请人地址: US MA Woburn
- 专利权人: L-3 Communications Security and Detection systems, Inc.
- 当前专利权人: L-3 Communications Security and Detection systems, Inc.
- 当前专利权人地址: US MA Woburn
- 主分类号: G21K5/10
- IPC分类号: G21K5/10
摘要:
An angular analysis system that can be controlled to receive radiation at a defined angle from a defined focus region. The angular analysis system is used for level 2 inspection in an explosive detection system. Level 2 inspection is provided by a three-dimensional inspection system that identifies suspicious regions of items under inspection. The angular analysis system is focused to gather radiation scattered at defined angles from the suspicious regions. Focusing may be achieved in multiple dimensions by movement of source and detector assemblies in a plane parallel to a plane holding the item under inspection. Focusing is achieved by independent motion of the source and detector assemblies. This focusing arrangement provides a compact device, providing simple, low cost and accurate operation.
公开/授权文献
- US07653176B2 Inspection system with material identification 公开/授权日:2010-01-26
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