A method includes measuring a temperature for a portion of an electronic component, determining the voltage being applied to the portion of the component, and determining a leakage power for the component portion based on a measured temperature and determined voltage for the portion of the component. The method also includes measuring a temperature for another portion of the component, determining the voltage being applied to the other component portion, and determining a leakage power for the other component portion based on the measured temperature and determined voltage for the other portion of the component. The method also includes summing the leakage power for the portion with the leakage power for the other portion of the component.