发明申请
- 专利标题: Substrate cleaning system and substrate cleaning method
- 专利标题(中): 基板清洗系统和基板清洗方法
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申请号: US11474486申请日: 2006-06-26
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公开(公告)号: US20070006904A1公开(公告)日: 2007-01-11
- 发明人: Takehiro Hagiwara , Tatsuo Kataoka , Seiji Noda , Takafumi Nakai
- 申请人: Takehiro Hagiwara , Tatsuo Kataoka , Seiji Noda , Takafumi Nakai
- 申请人地址: JP Tokyo
- 专利权人: SPC ELECTRONICS CORPORATION
- 当前专利权人: SPC ELECTRONICS CORPORATION
- 当前专利权人地址: JP Tokyo
- 优先权: JP2005-185941 20050627; JP2006-144690 20060524
- 主分类号: B08B3/00
- IPC分类号: B08B3/00 ; B08B3/12
摘要:
A substrate cleaning system that cleans a glass substrate by supplying liquid and gas to spray nozzles and by spraying fluid, where the liquid and the gas are mixed in the spray nozzles, onto the substrate in order to effectively remove foreign objects attached on the end surface of substrate after performing mechanical cut-off or polishing treatment, the system has: liquid heating means for heating the liquid to be supplied to the spray nozzles to control the temperature of the liquid, in which the temperature of the liquid at the inlet of the spray nozzles is controlled at 40° C. to 100° C.
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