发明申请
US20070012335A1 Photomask cleaning using vacuum ultraviolet (VUV) light cleaning
审中-公开
使用真空紫外线(VUV)清洁光掩模
- 专利标题: Photomask cleaning using vacuum ultraviolet (VUV) light cleaning
- 专利标题(中): 使用真空紫外线(VUV)清洁光掩模
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申请号: US11184703申请日: 2005-07-18
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公开(公告)号: US20070012335A1公开(公告)日: 2007-01-18
- 发明人: Hsiao Chang , Tsun-Cheng Tang , Fei-Gwo Tsai , Tzu-Li Lee , Chien-Ming Chiu , Jang Lee , Yih-Chen Su , Chih-Cheng Lin , Tung Kang , Hung Hsieh
- 申请人: Hsiao Chang , Tsun-Cheng Tang , Fei-Gwo Tsai , Tzu-Li Lee , Chien-Ming Chiu , Jang Lee , Yih-Chen Su , Chih-Cheng Lin , Tung Kang , Hung Hsieh
- 主分类号: B08B3/12
- IPC分类号: B08B3/12 ; B08B3/00 ; B08B6/00
摘要:
A multi-step cleaning procedure cleans phase shift photomasks and other photomasks and Mo-containing surfaces. In one embodiment, vacuum ultraviolet (VUV) light produced by an Xe2 excimer laser converts oxygen to ozone that is used in a first cleaning operation. The VUV/ozone clean may be followed by a wet SC1 chemical clean and the two-step cleaning procedure reduces phase-shift loss and increases transmission. In another embodiment, the first step may use other means to form a molybdenum oxide on the Mo-containing surface. In another embodiment, the multi-step cleaning operation provides a wet chemical clean such as SC1 or SPM or both, followed by a further chemical or physical treatment such as ozone, baking or electrically ionized water.
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