发明申请
US20070020900A1 Highly doped gate electrode made by rapidly melting and resolidifying the gate electrode
有权
通过快速熔化和重新固化栅电极制成的高掺杂栅电极
- 专利标题: Highly doped gate electrode made by rapidly melting and resolidifying the gate electrode
- 专利标题(中): 通过快速熔化和重新固化栅电极制成的高掺杂栅电极
-
申请号: US11175682申请日: 2005-07-06
-
公开(公告)号: US20070020900A1公开(公告)日: 2007-01-25
- 发明人: Amitabh Jain
- 申请人: Amitabh Jain
- 申请人地址: US TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: US TX Dallas
- 主分类号: H01L21/3205
- IPC分类号: H01L21/3205
摘要:
The present invention provides, in one embodiment, a method for fabricating a microelectronic device. The method comprises implanting a dopant into a gate electrode located on a substrate. The gate electrode has a melting point below a melting point of the substrate. The method also comprises melting the gate electrode to allow the dopant to diffuse throughout the gate electrode. The method further comprises re-solidifying the gate electrode to increase dopant-occupied substitutional sites within the gate electrode.
公开/授权文献
信息查询
IPC分类: