发明申请
- 专利标题: Dry etching process and method for manufacturing magnetic memory device
- 专利标题(中): 干蚀刻工艺及其制造方法
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申请号: US10568960申请日: 2004-08-26
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公开(公告)号: US20070026681A1公开(公告)日: 2007-02-01
- 发明人: Toshiaki Shiraiwa , Tetsuya Tatsumi , Seiji Samukawa
- 申请人: Toshiaki Shiraiwa , Tetsuya Tatsumi , Seiji Samukawa
- 申请人地址: JP Tokyo
- 专利权人: SONY CORPORATION
- 当前专利权人: SONY CORPORATION
- 当前专利权人地址: JP Tokyo
- 优先权: JP2003-303410 20030827
- 国际申请: PCT/JP04/12292 WO 20040826
- 主分类号: H01L21/302
- IPC分类号: H01L21/302
摘要:
Provision of a process capable of preferably etching particularly PtMn used for a pin layer of an MRAM is an object: a dry etching method for performing dry etching on a layer including platinum and/or manganese by using pulse plasma and a production method of an MRAM, wherein the dry etching method is applied to processing of the pin layer. The MRAM is configured to have a memory portion comprising a magnetic memory element composed of tunnel magnetoresistive effect element formed by stacking a magnetic fixed layer having a fixed magnetization direction, a tunnel barrier layer and a magnetic layer capable of changing the magnetization direction.
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