发明申请
- 专利标题: Methods of Forming Conductive Polysilicon Thin Films Via Atomic Layer Deposition and Methods of Manufacturing Semiconductor Devices Including Such Polysilicon Thin Films
- 专利标题(中): 通过原子层沉积形成导电多晶硅薄膜的方法和制造包括这种多晶硅薄膜的半导体器件的方法
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申请号: US11421111申请日: 2006-05-31
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公开(公告)号: US20070042573A1公开(公告)日: 2007-02-22
- 发明人: Jin-Gyun Kim , Ki-Hyun Hwang , Jin-Tae Noh , Hong-Suk Kim , Sung-Hae Lee
- 申请人: Jin-Gyun Kim , Ki-Hyun Hwang , Jin-Tae Noh , Hong-Suk Kim , Sung-Hae Lee
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 优先权: KR10-2005-0076974 20050822
- 主分类号: H01L21/20
- IPC分类号: H01L21/20
摘要:
A method of forming a conductive polysilicon thin film and a method of manufacturing a semiconductor device using the same are provided. The method of forming a conductive polysilicon thin film may comprise simultaneously supplying a Si precursor having halogen elements as a first reactant and a dopant to a substrate to form a first reactant adsorption layer that is doped with impurities on the substrate and then supplying a second reactant having H (hydrogen) to the first reactant adsorption layer to react the H of the second reactant with the halogen elements of the first reactant to form a doped Si atomic layer on the substrate.