发明申请
- 专利标题: Multistep etching method
- 专利标题(中): 多步蚀刻法
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申请号: US11221487申请日: 2005-09-07
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公开(公告)号: US20070054447A1公开(公告)日: 2007-03-08
- 发明人: Hsin Tai , Chung-Ju Lee , Chih-Ning Wu
- 申请人: Hsin Tai , Chung-Ju Lee , Chih-Ning Wu
- 主分类号: H01L21/8234
- IPC分类号: H01L21/8234 ; H01L21/302 ; H01L21/3205 ; H01L21/336
摘要:
A multi-step etching method is provided. First, a substrate including a gate over the substrate and a spacer over the gate is provided. Then, an anisotropic etching step is performed for etching a first region and a second region in the substrate at two sides of the gate. Thereafter, an isotropic etching step is performed for etching a first external region under the spacer and adjacent to the first region, and etching a second external region under the spacer and adjacent to the second region. Then, a filling step is performed for filling a material into the first region, the first external region, the second region and the second external region.
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