发明申请
- 专利标题: INTEGRATED CIRCUIT WITH SELF-ALIGNED LINE AND VIA
- 专利标题(中): 集成电路与自对准线和威盛
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申请号: US11466018申请日: 2006-08-21
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公开(公告)号: US20070075371A1公开(公告)日: 2007-04-05
- 发明人: Yeow Lim , Randall Cha , Alex See , Wang Goh
- 申请人: Yeow Lim , Randall Cha , Alex See , Wang Goh
- 申请人地址: SG Singapore
- 专利权人: CHARTERED SEMICONDUCTOR MANUFACTURING LTD.
- 当前专利权人: CHARTERED SEMICONDUCTOR MANUFACTURING LTD.
- 当前专利权人地址: SG Singapore
- 主分类号: H01L23/62
- IPC分类号: H01L23/62
摘要:
An integrated circuit is provided having a base with a first dielectric layer formed thereon. A second dielectric layer is formed over the first dielectric layer. A third dielectric layer is formed in spaced-apart strips over the second dielectric layer. A first trench opening is formed through the first and second dielectric layers between the spaced-apart strips of the third dielectric layer. A second trench opening is formed contiguously with the first trench opening through the first dielectric layer between the spaced-apart strips of the third dielectric layer. Conductor metals in the trench openings form self-aligned trench interconnects.
公开/授权文献
- US08766454B2 Integrated circuit with self-aligned line and via 公开/授权日:2014-07-01
信息查询
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