Invention Application
US20070076232A1 Microscope system and method for shading correction of lenses present in the microscope system
审中-公开
显微镜系统和显微镜系统中存在的镜片的阴影校正方法
- Patent Title: Microscope system and method for shading correction of lenses present in the microscope system
- Patent Title (中): 显微镜系统和显微镜系统中存在的镜片的阴影校正方法
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Application No.: US10597555Application Date: 2004-12-22
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Publication No.: US20070076232A1Publication Date: 2007-04-05
- Inventor: Frank Olschewski , Jochen Nickel , William Hay
- Applicant: Frank Olschewski , Jochen Nickel , William Hay
- Applicant Address: DE Wetzlar 35578
- Assignee: Leica Microsystems CMS GmbH
- Current Assignee: Leica Microsystems CMS GmbH
- Current Assignee Address: DE Wetzlar 35578
- Priority: DE10-2004-004115.6 20040128
- International Application: PCT/EP04/53659 WO 20041222
- Main IPC: H04N1/60
- IPC: H04N1/60

Abstract:
A microscope system includes at least one lens that defines an illumination field and at least one light source that emits an illuminating light beam for illuminating a specimen through the lens. At least one detector is provided for, pixel-by-pixel, detecting a detection light beam coming from the specimen. An electronic circuit is connected downstream from the detector, the electronic circuit including a memory unit for storing a wavelength-dependent brightness distribution of an illumination field of the at least one lens. The electronic circuit employs, pixel-by-pixel, the stored wavelength-dependent brightness distribution so as to form a homogeneously illuminated image field. An actuatable element is provided for controlling, pixel-by-pixel, an intensity of the illuminating light beam as a function of the stored wavelength-dependent brightness distribution so as to homogeneously illuminate the illumination field.
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