发明申请
- 专利标题: SYSTEMS AND METHODS FOR DETECTING DEVICE-UNDER-TEST DEPENDENCY
- 专利标题(中): 用于检测设备的测试依据的系统和方法
-
申请号: US11245532申请日: 2005-10-07
-
公开(公告)号: US20070082581A1公开(公告)日: 2007-04-12
- 发明人: Volume Chien , Chyi-Shyuan Chern , Yu Yuan Kuo , Ming-Te Mo
- 申请人: Volume Chien , Chyi-Shyuan Chern , Yu Yuan Kuo , Ming-Te Mo
- 专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 主分类号: B24B49/00
- IPC分类号: B24B49/00 ; G06F19/00
摘要:
A system of process control is provided. The system comprises a first processing tool, a first sensor, a second processing tool, and a processor. The first processing tool processes a first workpiece. The first sensor provides real-time monitoring (RTM) data of the first processing tool while processing the first workpiece. The second processing tool processes the first workpiece subsequent to the first processing tool. The processor adjusts, according to the real-time monitoring data and a preset program, the first processing tool for processing a second workpiece, and the second processing tool for processing the first workpiece.
公开/授权文献
信息查询