- 专利标题: Measuring apparatus, measuring method, and test apparatus
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申请号: US11497506申请日: 2006-08-01
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公开(公告)号: US20070096762A1公开(公告)日: 2007-05-03
- 发明人: Tomoyuki Yamane , Hirokatsu Niijima
- 申请人: Tomoyuki Yamane , Hirokatsu Niijima
- 申请人地址: JP Tokyo
- 专利权人: Advantest Corporation
- 当前专利权人: Advantest Corporation
- 当前专利权人地址: JP Tokyo
- 优先权: JP2004-029751 20040205
- 主分类号: G01R31/26
- IPC分类号: G01R31/26
摘要:
There is provided a measuring apparatus that generates a first strobe signal and a second strobe signal in synchronization with an output signal, sequentially changes phases of the strobe signals whenever the electronic device outputs the output signal multiple times, acquires a signal level of the output signal at each phase of the strobe signals by the multiple times, counts the number of times by which the signal level of the output signal to the first strobe signal is a High level for each phase of the first strobe signal, counts the number of times by which the signal level of the output signal to the second strobe signal is a Low level for each phase of the second strobe signal, and computes a phase of a variation point of a waveform of the output signal, a jitter amount, and distribution of jitter based on the counted number of times. The measuring apparatus measures a variation point of a waveform of the output signal, a jitter amount, and distribution of jitter by one-time test.
公开/授权文献
- US07262627B2 Measuring apparatus, measuring method, and test apparatus 公开/授权日:2007-08-28
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