发明申请
- 专利标题: Exposure apparatus and device manufacturing method
- 专利标题(中): 曝光装置和装置制造方法
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申请号: US11651551申请日: 2007-01-10
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公开(公告)号: US20070109517A1公开(公告)日: 2007-05-17
- 发明人: Hiroaki Takaiwa , Takashi Horiuchi
- 申请人: Hiroaki Takaiwa , Takashi Horiuchi
- 申请人地址: JP Tokyo
- 专利权人: Nikon Corporation
- 当前专利权人: Nikon Corporation
- 当前专利权人地址: JP Tokyo
- 优先权: JP2004-026864 20040203
- 主分类号: G03B27/42
- IPC分类号: G03B27/42
摘要:
A lithographic projection apparatus includes a substrate table configured to hold a substrate, a projection system arranged to project a patterned beam of radiation onto the substrate, a liquid supply system configured to supply liquid to a space between the projection system and the substrate, and a residual liquid detector configured to detect liquid remaining on the substrate and/or the substrate table after an exposure is completed. A device manufacturing method includes projecting, using a projection system of a lithographic apparatus, a patterned beam of radiation through a liquid onto a substrate, the substrate being held by a substrate table, and, after the projecting is complete, detecting residual liquid on the substrate and/or the substrate table.
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