发明申请
- 专利标题： Methods for improving mold quality for use in the manufacture of liquid crystal display components
- 专利标题（中）： 提高用于制造液晶显示元件的模具品质的方法
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申请号： US11285137申请日： 2005-11-21
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公开(公告)号： US20070114693A1公开(公告)日： 2007-05-24
- 发明人: Paul Buckley , Kevin Capaldo , Jamuna Chakravarti , Mark Cheverton , David Clinnin , Michael Davis , Robert Little , Vijay Paruchuru , Micah Sze , Sameer Talsania , Vicki Watkins , Masako Yamada , Jana York , Kenneth Zarnoch
- 申请人： Paul Buckley , Kevin Capaldo , Jamuna Chakravarti , Mark Cheverton , David Clinnin , Michael Davis , Robert Little , Vijay Paruchuru , Micah Sze , Sameer Talsania , Vicki Watkins , Masako Yamada , Jana York , Kenneth Zarnoch
- 主分类号： B29C73/00
- IPC分类号： B29C73/00 ; B29C45/76
摘要：
Disclosed herein is a method comprising inspecting a mold for a defect; determining a type of defect present on the mold; sorting the mold by type of defect present; treating the mold with a cleaning process that is suitable to remove the defect; and pressing the mold against a polymeric film to produce a series of defect free light management films; wherein the yield of light management films manufactured from the mold is higher than the yield of light management films that are produced from a comparative mold that has not been treated with the cleaning process.
信息查询
