Invention Application
- Patent Title: Method and apparatus for interconnect diagnosis
- Patent Title (中): 用于互连诊断的方法和装置
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Application No.: US11284354Application Date: 2005-11-21
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Publication No.: US20070115004A1Publication Date: 2007-05-24
- Inventor: Russell Mirov , Howard Davidson
- Applicant: Russell Mirov , Howard Davidson
- Assignee: Sun Microsystems, Inc.
- Current Assignee: Sun Microsystems, Inc.
- Main IPC: G01R31/04
- IPC: G01R31/04

Abstract:
A system configured to detect faults in signal lines. A system includes a first component configured to communicate with a second component via a signal path including one or more signal traces. Sense signal lines are manufactured such that at some point they are in close proximity to a signal trace which is to be monitored. The sense signal lines are configured to use parasitic coupling to redirect a portion of a signal conveyed via a signal trace to a monitoring component. The first component is configured to convey a test signal indicative of a type of test via the signal path, and a reference signal to the monitoring component. The monitoring component is configured to utilize the reference signal to ascertain a presence or absence, or characteristics of a received redirected signal. The monitoring component may optionally utilize a locally generated reference signal.
Public/Granted literature
- US07514937B2 Method and apparatus for interconnect diagnosis Public/Granted day:2009-04-07
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