发明申请
- 专利标题: Power IGBT with increased robustness
- 专利标题(中): 功率IGBT具有增强的鲁棒性
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申请号: US11598243申请日: 2006-11-09
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公开(公告)号: US20070120181A1公开(公告)日: 2007-05-31
- 发明人: Holger Ruething , Hans-Joachim Schulze , Manfred Pfaffenlehner
- 申请人: Holger Ruething , Hans-Joachim Schulze , Manfred Pfaffenlehner
- 申请人地址: DE Munich
- 专利权人: Infineon Technologies AG
- 当前专利权人: Infineon Technologies AG
- 当前专利权人地址: DE Munich
- 优先权: DE102005053487.2-33 20051109
- 主分类号: H01L29/76
- IPC分类号: H01L29/76
摘要:
A power IGBT includes a semiconductor body having an emitter zone of a first conduction type and a drift zone of a second conduction type proximate to the emitter zone. The IGBT further includes a cell array, each transistor cell of the array having a source zone, a body zone disposed between the source zone and the drift zone, the body zone and source zone short-circuited, and a gate electrode configured to be insulated with respect to the source zone and the body zone. The cell array has a first cell array section with a first cell density and a second cell array section with a second cell density that is lower than the first cell density. The emitter zone has a lower emitter efficiency in a region corresponding to the second cell array section than in a region corresponding to the first cell array section.
公开/授权文献
- US07470952B2 Power IGBT with increased robustness 公开/授权日:2008-12-30
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