Invention Application
US20070146472A1 Method for scanner control in at least one scan axis in a laser scanning microscope
有权
在激光扫描显微镜中至少一个扫描轴上扫描仪控制的方法
- Patent Title: Method for scanner control in at least one scan axis in a laser scanning microscope
- Patent Title (中): 在激光扫描显微镜中至少一个扫描轴上扫描仪控制的方法
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Application No.: US10583346Application Date: 2004-12-16
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Publication No.: US20070146472A1Publication Date: 2007-06-28
- Inventor: Joerg Steinert
- Applicant: Joerg Steinert
- Priority: DE10359734.4 20031219
- International Application: PCT/EP04/14318 WO 20041216
- Main IPC: B41J2/45
- IPC: B41J2/45
Abstract:
Method for scanner control in at least one scan axis in a laser scanning microscope, the scan field being divided into partial area, a first image of at least one partial area produced by a forward scan being compared with a second image of the partial area produced by a back scan and a correction value for the scanner control determined from the deviation between the first and second image.
Public/Granted literature
- US07796149B2 Method for scanner control in at least one scan axis in a laser scanning microscope Public/Granted day:2010-09-14
Information query
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