Invention Application
- Patent Title: Littrow interferometer
- Patent Title (中): Littrow干涉仪
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Application No.: US11316855Application Date: 2005-12-23
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Publication No.: US20070146722A1Publication Date: 2007-06-28
- Inventor: William Trutna , Geraint Owen , Alan Ray , James Prince , Eric Johnstone , Miao Zhu , Leonard Cutler
- Applicant: William Trutna , Geraint Owen , Alan Ray , James Prince , Eric Johnstone , Miao Zhu , Leonard Cutler
- Main IPC: G01B9/02
- IPC: G01B9/02

Abstract:
An apparatus and method for measuring displacement includes a light beam directed to an interferometer core that splits the light beam into first and second component beams. The first component beam is directed to a diffraction grating at approximately a Littrow angle. A diffraction is received by the interferometer core and is combined with the second component beam. The combination of the first and second component beams is measured to determine displacement of the diffraction grating.
Public/Granted literature
- US07440113B2 Littrow interferometer Public/Granted day:2008-10-21
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