发明申请
- 专利标题: METHODS OF FORMING MAGNETIC RANDOM ACCESS MEMORY DEVICES HAVING TITANIUM-RICH LOWER ELECTRODES WITH OXIDE LAYER AND ORIENTED TUNNELING BARRIER
- 专利标题(中): 形成具有氧化物层和面向隧道网的钛电极的磁性随机存取存储器件的方法
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申请号: US11673612申请日: 2007-02-12
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公开(公告)号: US20070148789A1公开(公告)日: 2007-06-28
- 发明人: Jun-Soo Bae , Jang-Eun Lee , Hyun-Jo Kim , In-Gyu Baek , Young-Ki Ha
- 申请人: Jun-Soo Bae , Jang-Eun Lee , Hyun-Jo Kim , In-Gyu Baek , Young-Ki Ha
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 优先权: KR2003-0046796 20030710
- 主分类号: H01L21/00
- IPC分类号: H01L21/00 ; H01L21/8244
摘要:
Magnetic Random Access Memory (MRAM) devices include a lower electrode and a magnetic tunnel junction on the lower electrode. The magnetic tunnel junction includes a seed layer and a tunneling barrier that is oriented in a same direction as the most closely packed plane direction of the seed layer. An oxide layer may be provided between the lower electrode and the magnetic tunnel junction. The lower electrode may be a titanium-rich TiN layer having more than 50 atomic percent titanium content. Analogous fabrication methods are also described.
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