发明申请
US20070155178A1 Slurry for chemical mechanical polishing process and method of manufacturing semiconductor device using the same
审中-公开
用于化学机械抛光工艺的浆料及使用其制造半导体器件的方法
- 专利标题: Slurry for chemical mechanical polishing process and method of manufacturing semiconductor device using the same
- 专利标题(中): 用于化学机械抛光工艺的浆料及使用其制造半导体器件的方法
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申请号: US11712931申请日: 2007-03-01
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公开(公告)号: US20070155178A1公开(公告)日: 2007-07-05
- 发明人: Young-rae Park , Jung-yup Kim , Bo-un Yoon , Kwang-bok Kim , Jae-phill Boo , Jong-won Lee , Sang-rok Hah , Kyung-hyun Kim , Chang-ki Hong
- 申请人: Young-rae Park , Jung-yup Kim , Bo-un Yoon , Kwang-bok Kim , Jae-phill Boo , Jong-won Lee , Sang-rok Hah , Kyung-hyun Kim , Chang-ki Hong
- 申请人地址: KR Suwon-si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR10-2000-0027503 20000522
- 主分类号: H01L21/306
- IPC分类号: H01L21/306 ; H01L21/461 ; B44C1/22 ; C23F1/00 ; H01L21/302
摘要:
A slurry composition useful for chemical mechanical polishing of the surface of a material layer, e.g., a silicon oxide layer, is disclosed. A first material surface which is exposed to the slurry exhibits hydrophilicity, while a second material layer, e.g., a polysilicon layer, the surface of which is also exposed to the slurry, exhibits hydrophobicity, and accordingly acts as a polishing stopping layer. The slurry composition consists essentially of water, abrasive grains, and a polymer additive having both hydrophilic and hydrophobic functional groups.
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