Invention Application
US20070183245A1 Voltage reset circuits for a semiconductor memory device using option fuse circuit and methods of resetting the same
失效
使用选项保险丝电路的半导体存储器件的电压复位电路及其复位方法
- Patent Title: Voltage reset circuits for a semiconductor memory device using option fuse circuit and methods of resetting the same
- Patent Title (中): 使用选项保险丝电路的半导体存储器件的电压复位电路及其复位方法
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Application No.: US11642105Application Date: 2006-12-20
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Publication No.: US20070183245A1Publication Date: 2007-08-09
- Inventor: Hee-Won Lee , Dae-Seok Byeon , Wook-Ghee Hahn
- Applicant: Hee-Won Lee , Dae-Seok Byeon , Wook-Ghee Hahn
- Priority: KR2006-10843 20060203
- Main IPC: G11C17/18
- IPC: G11C17/18

Abstract:
Control circuits for a voltage regulator of a semiconductor memory device include an option fuse circuit and a fusing control circuit. The option fuse circuit includes a plurality of fuses and a selection circuit that selects one of the plurality of fuses responsive to a control signal. An output voltage associated with the voltage reset circuit is adjusted responsive to a state of the selected one of the plurality of fuses. A fusing control circuit generates the control signal to allow multiple adjustments of the output voltage by the voltage reset circuit. The option fuse circuit may be a plurality of option fuse circuits and the output voltage may be adjusted responsive to the states of the respective selected ones of the plurality of fuses of the option fuse circuits.
Public/Granted literature
- US07505350B2 Voltage reset circuits for a semiconductor memory device using option fuse circuit Public/Granted day:2009-03-17
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