发明申请
US20070189449A1 Method and measuring arrangement for nondestructive analysis of an examination object by means of x-radiation 有权
通过x射线对检查对象进行非破坏性分析的方法和测量装置

Method and measuring arrangement for nondestructive analysis of an examination object by means of x-radiation
摘要:
A method and a measuring arrangement are disclosed for nondestructive analysis of an examination object. In at least one embodiment of the method, x-radiation having a specific energy spectrum is generated by an x-ray source, with the aid of at least one x-ray/optical grating in the beam path of the x-radiation there is generated a standing wave field of this x-radiation that is positioned at least partially in the examination object, and the radiation excited by the x-ray standing wave field in the examination object is measured as a function of at least one relative position between the examination object and the x-ray standing wave field. Further, a material distribution in the examination object is inferred from the measurement result of the radiation excited by the x-ray standing wave field.
信息查询
0/0