Invention Application
- Patent Title: Method and measuring arrangement for nondestructive analysis of an examination object by means of x-radiation
- Patent Title (中): 通过x射线对检查对象进行非破坏性分析的方法和测量装置
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Application No.: US11700061Application Date: 2007-01-31
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Publication No.: US20070189449A1Publication Date: 2007-08-16
- Inventor: Joachim Baumann , Martin Engelhardt , Jorg Freudenberger , Eckhard Hempel , Martin Hoheisel , Thomas Mertelmeier , Stefan Popescu , Manfred Schuster
- Applicant: Joachim Baumann , Martin Engelhardt , Jorg Freudenberger , Eckhard Hempel , Martin Hoheisel , Thomas Mertelmeier , Stefan Popescu , Manfred Schuster
- Priority: DE102006004604.8 20060201; DE102006004976.4 20060201; DE102006037257.3 20060809
- Main IPC: G01N23/223
- IPC: G01N23/223 ; G01T1/36

Abstract:
A method and a measuring arrangement are disclosed for nondestructive analysis of an examination object. In at least one embodiment of the method, x-radiation having a specific energy spectrum is generated by an x-ray source, with the aid of at least one x-ray/optical grating in the beam path of the x-radiation there is generated a standing wave field of this x-radiation that is positioned at least partially in the examination object, and the radiation excited by the x-ray standing wave field in the examination object is measured as a function of at least one relative position between the examination object and the x-ray standing wave field. Further, a material distribution in the examination object is inferred from the measurement result of the radiation excited by the x-ray standing wave field.
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