发明申请
US20070189460A1 Precise x-ray inspection system 审中-公开
精密X光检查系统

Precise x-ray inspection system
摘要:
Methods and apparatus for reducing detection of x-ray scatter in an x-ray system are described featuring one or more x-ray sources, one or more sensors, one or more field blocks configured to limit the field of view of the one or more sensors, one or more collimators configured to direct x-rays generated by the one or more x-ray sources in the direction of the one or more sensors, and a relative motion mechanism configured to alter a position of an object under inspection relative to the x-ray source and the one or more sensors.
信息查询
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