发明申请
- 专利标题: Precise x-ray inspection system
- 专利标题(中): 精密X光检查系统
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申请号: US11355062申请日: 2006-02-15
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公开(公告)号: US20070189460A1公开(公告)日: 2007-08-16
- 发明人: Dean Buck , Ronald Kerschner , David Reynolds
- 申请人: Dean Buck , Ronald Kerschner , David Reynolds
- 主分类号: G21K5/10
- IPC分类号: G21K5/10
摘要:
Methods and apparatus for reducing detection of x-ray scatter in an x-ray system are described featuring one or more x-ray sources, one or more sensors, one or more field blocks configured to limit the field of view of the one or more sensors, one or more collimators configured to direct x-rays generated by the one or more x-ray sources in the direction of the one or more sensors, and a relative motion mechanism configured to alter a position of an object under inspection relative to the x-ray source and the one or more sensors.
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