发明申请
- 专利标题: PHASE CHANGEABLE STRUCTURE AND METHOD OF FORMING THE SAME
- 专利标题(中): 相变结构及其形成方法
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申请号: US11674580申请日: 2007-02-13
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公开(公告)号: US20070190683A1公开(公告)日: 2007-08-16
- 发明人: Jun-Soo BAE , Hideki HORII , Ji-Hye YI , Young-Soo LIM
- 申请人: Jun-Soo BAE , Hideki HORII , Ji-Hye YI , Young-Soo LIM
- 申请人地址: KR Gyeonggi-do
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Gyeonggi-do
- 优先权: KR2006-0013431 20060213; KR2007-11995 20070206
- 主分类号: H01L21/00
- IPC分类号: H01L21/00
摘要:
The present invention relates to a phase changeable structure having decreased amounts of defects and a method of forming the phase changeable structure. A stacked composite is first formed by (i) forming a phase changeable layer including a chalcogenide is formed on a lower electrode, (ii) forming an etch stop layer having a first etch rate with respect to a first etching material including chlorine on the phase changeable layer, and (iii) forming a conductive layer having a second etch rate with respect to the first etching material on the etch stop layer. The conductive layer of the stacked composite is then etched using the first etching material to form an upper electrode. The etch stop layer and the phase changeable layer are then etched using a second etching material that is substantially flee of chlorine to form an etch stop pattern and a phase changeable pattern, respectively.
公开/授权文献
- US07569430B2 Phase changeable structure and method of forming the same 公开/授权日:2009-08-04
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