发明申请
US20070196843A1 Method for identification and monitoring of epigenetic modifications 审中-公开
鉴定和监测表观遗传修饰的方法

Method for identification and monitoring of epigenetic modifications
摘要:
The present invention provides novel methods for identifying and monitoring epigenetic modifications, such as imprinted genes, using microarray based technology. Specifically, the invention detects imprinted genes by the presence of overlapping closed and open chromatin markers. The invention also discloses a method for detecting the loss of imprinting on a genome-wide scale, which is indicative of a variety of medical conditions. Diagnostic assays and chromatin structure markers for identifying gene imprinting and loss thereof are also disclosed.
信息查询
0/0