Invention Application
US20070201293A1 Testing method for permanent electrical removal of an integrated circuit output 失效
用于永久电除去集成电路输出的测试方法

  • Patent Title: Testing method for permanent electrical removal of an integrated circuit output
  • Patent Title (中): 用于永久电除去集成电路输出的测试方法
  • Application No.: US11711450
    Application Date: 2007-02-26
  • Publication No.: US20070201293A1
    Publication Date: 2007-08-30
  • Inventor: Alan Wheeler
  • Applicant: Alan Wheeler
  • Main IPC: G11C17/18
  • IPC: G11C17/18 H03K19/007
Testing method for permanent electrical removal of an integrated circuit output
Abstract:
An apparatus and method of disconnecting or disabling an input/output terminal of an integrated circuit after packaging. Each input/output terminal of the integrated circuit includes a disabling device coupled thereto between the input/output terminal and the output driver of the respective input/output terminal. A DRAM module is disclosed having a plurality of partially good DRAM devices wherein the known bad input/output terminals are permanently disconnected using a disabling device, both the known good and known bad input/output terminals being coupled to conductive traces of a carrier substrate.
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