Invention Application
- Patent Title: Testing method for permanent electrical removal of an integrated circuit output
- Patent Title (中): 用于永久电除去集成电路输出的测试方法
-
Application No.: US11711450Application Date: 2007-02-26
-
Publication No.: US20070201293A1Publication Date: 2007-08-30
- Inventor: Alan Wheeler
- Applicant: Alan Wheeler
- Main IPC: G11C17/18
- IPC: G11C17/18 ; H03K19/007

Abstract:
An apparatus and method of disconnecting or disabling an input/output terminal of an integrated circuit after packaging. Each input/output terminal of the integrated circuit includes a disabling device coupled thereto between the input/output terminal and the output driver of the respective input/output terminal. A DRAM module is disclosed having a plurality of partially good DRAM devices wherein the known bad input/output terminals are permanently disconnected using a disabling device, both the known good and known bad input/output terminals being coupled to conductive traces of a carrier substrate.
Public/Granted literature
- US07627796B2 Testing method for permanent electrical removal of an integrated circuit output Public/Granted day:2009-12-01
Information query