发明申请
- 专利标题: ADVANCED PATTERN RECOGNITION SYSTEMS FOR SPECTRAL ANALYSIS
- 专利标题(中): 用于光谱分析的高级图案识别系统
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申请号: US11624121申请日: 2007-01-17
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公开(公告)号: US20070211248A1公开(公告)日: 2007-09-13
- 发明人: H.J. Caulfield , David Frank , Jamie Seter
- 申请人: H.J. Caulfield , David Frank , Jamie Seter
- 申请人地址: US FL Boca Raton
- 专利权人: Innovative American Technology, Inc.
- 当前专利权人: Innovative American Technology, Inc.
- 当前专利权人地址: US FL Boca Raton
- 主分类号: G01J3/44
- IPC分类号: G01J3/44
摘要:
A process of rapid and highly accurate analysis of spectral data, includes both a linear scanning (LINSCAN) method and an advanced peak detection method for pattern recognition. One or both of the methods are used to support the detection and identification of chemical, biological, radiation, nuclear and explosive materials. The spectra of various targets can be analyzed by the two spectral analysis methods. These two methods can be combined for dual confirmation, greater accuracy, and to reduced false positives and false negatives, relative to what can be accomplished by either alone.
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