发明申请
- 专利标题: Measuring apparatus and measuring method
- 专利标题(中): 测量装置和测量方法
-
申请号: US11726858申请日: 2007-03-23
-
公开(公告)号: US20070222670A1公开(公告)日: 2007-09-27
- 发明人: Shinya Takenouchi , Hoshibumi Ichiyanagi , Yasuhiro Satoh
- 申请人: Shinya Takenouchi , Hoshibumi Ichiyanagi , Yasuhiro Satoh
- 申请人地址: JP Kyoto
- 专利权人: OMRON Corporation
- 当前专利权人: OMRON Corporation
- 当前专利权人地址: JP Kyoto
- 优先权: JP2006-081259 20060323
- 主分类号: G01S13/08
- IPC分类号: G01S13/08 ; G01S13/42 ; G01S13/93
摘要:
A measuring apparatus for measuring a distance from an object to be measured has, a transmitting means for alternately modulating amplitudes of a first continuous wave having a first frequency and a second continuous wave having a second frequency for transmitting a transmission signal as a carrier wave using an AM signal. The AM signal is produced by an AM producing circuit for modulating the amplitudes. The transmission signal is reflected as a reflection signal by the object to be measured and received by a receiving circuit. A first distance calculating circuit calculates the distance using a phase difference between the first and second continuous waves. A second distance calculating circuit is used for demodulating the receipt signal, detecting a phase difference, and calculating a distance from the object to be measured using the detected phase difference. A determining circuit determines a final distance measurement based on the above calculations.
公开/授权文献
- US07330148B2 Measuring apparatus and measuring method 公开/授权日:2008-02-12
信息查询