发明申请
- 专利标题: Curved conduit ion sampling device and method
- 专利标题(中): 曲线管离子采样装置及方法
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申请号: US11398163申请日: 2006-04-05
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公开(公告)号: US20070235642A1公开(公告)日: 2007-10-11
- 发明人: Jean-Luc Truche , Paul Goodley , Steven Fischer , Jian Bal
- 申请人: Jean-Luc Truche , Paul Goodley , Steven Fischer , Jian Bal
- 主分类号: H01J49/00
- IPC分类号: H01J49/00
摘要:
An ion sampling apparatus for use in a mass spectrometry system. The ion sampling apparatus includes a target support for receiving a sample, an irradiation source for emitting energetic radiation or particles toward the target support, and a conduit having a curved end and a longitudinal axis, the curved end having an inlet with a central axis, the conduit being adjacent to the target support. The longitudinal axis of the conduit and the central axis of the inlet intersect to define an angle that is between about 20 degrees and about 210 degrees.
公开/授权文献
- US07423261B2 Curved conduit ion sampling device and method 公开/授权日:2008-09-09
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