发明申请
- 专利标题: Spectral analytical unit with a diffraction grating
- 专利标题(中): 具有衍射光栅的光谱分析单元
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申请号: US11785153申请日: 2007-04-16
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公开(公告)号: US20070242268A1公开(公告)日: 2007-10-18
- 发明人: Hans-Juergen Dobschal , Ralf Wolleschensky , Wolfgang Bathe , Joerg Steinert
- 申请人: Hans-Juergen Dobschal , Ralf Wolleschensky , Wolfgang Bathe , Joerg Steinert
- 优先权: DE102006017705.3 20060415
- 主分类号: G01J3/28
- IPC分类号: G01J3/28
摘要:
A spectral analytical unit for acting on a parallel light bundle having different wavelengths. The spectral analytical unit includes a diffraction grating on which the light bundle falls, the diffraction grating splitting the different wavelengths through diffraction in first spectral directions defining a light bundle diffraction order 1 without recycle, and the diffraction grating bending the light bundle in second directions defining a light bundle diffraction order 0 without recycle, a detector line made up of a plurality of elements, optics for focusing the split light bundle diffraction order 1 without recycle on the detector line, evaluation electronics connected to the detector line for obtaining data related to a created spectrum, and a deflecting device wherein the diffraction order 0 light bundle without recycle meets on the deflecting device which is so directed and positioned that this light bundle falls on the diffraction grating thereby creating a reflected diffraction order 1 light bundle with first recycle and a reflected diffraction order 0 light bundle with first recycle whereby the diffraction order 1 without recycle and the reflected diffraction order 1 light bundle with first recycle each of a part wavelength range are impressed through the optics on a single element of the detector line.
公开/授权文献
- US07852474B2 Spectral analysis unit with a diffraction grating 公开/授权日:2010-12-14
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