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发明申请
US20070247623A1 Polarization measuring devices, ellipsometers and polarization measuring methods 审中-公开
极化测量装置，椭偏仪和偏振测量方法

  • 专利标题： Polarization measuring devices, ellipsometers and polarization measuring methods
  • 专利标题（中）： 极化测量装置，椭偏仪和偏振测量方法
  • 申请号： US11723992
    申请日： 2007-03-23
  • 公开(公告)号： US20070247623A1
    公开(公告)日： 2007-10-25
  • 发明人: Dong-wan Kim , Dong-gun Lee , Kyoung-yoon Bang
  • 申请人： Dong-wan Kim , Dong-gun Lee , Kyoung-yoon Bang
  • 优先权： KR10-2006-0026699 20060323
  • 主分类号： G01J4/00
  • IPC分类号： G01J4/00
Polarization measuring devices, ellipsometers and polarization measuring methods
摘要：
A polarization measuring device includes a diffraction grating and a detector. The diffraction grating is configured to diffract incident light to observe the polarization state of the light. The detector is configured to receive the light diffracted by the diffraction grating and display the polarization state of the light.
摘要（中）：

偏振测量装置包括衍射光栅和检测器。 衍射光栅被配置为衍射入射光以观察光的偏振状态。 检测器被配置为接收由衍射光栅衍射的光并显示光的偏振状态。

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