发明申请
- 专利标题： Contactor and test method using contactor
- 专利标题（中）： 接触器和使用接触器的测试方法
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申请号： US11798188申请日： 2007-05-10
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公开(公告)号： US20070252608A1公开(公告)日： 2007-11-01
- 发明人: Daisuke Koizumi , Naohito Kohashi , Kazuhiro Tashiro , Takumi Kumatabara
- 申请人： Daisuke Koizumi , Naohito Kohashi , Kazuhiro Tashiro , Takumi Kumatabara
- 申请人地址： JP Kawasaki
- 专利权人： FUJITSU LIMITED
- 当前专利权人： FUJITSU LIMITED
- 当前专利权人地址： JP Kawasaki
- 主分类号： G01R31/02
- IPC分类号： G01R31/02
摘要：
A contact terminal formed of an electrically conductive material is arranged in each of a plurality of holed of a contactor substrate. An electrically conductive part is formed on an inner surface of each hole. The contact terminal has a first contact part that contacts a terminal of an electronic part and a second contact part that contacts the electrically conductive part in a middle portion. When the contact terminal bends by the first contact part being pressed, the second contact part contacts the electrically conductive part of the contactor substrate and an appropriate degree of contact pressure is obtained.
公开/授权文献
- US07825676B2 Contactor and test method using contactor 公开/授权日：2010-11-02