发明申请
- 专利标题: Plasma processing apparatus having an evacuating arrangement to evacuate gas from gas-introducing part of a process chamber
- 专利标题(中): 等离子体处理装置具有从处理室的气体导入部抽出气体的排气装置
-
申请号: US11785356申请日: 2007-04-17
-
公开(公告)号: US20070254113A1公开(公告)日: 2007-11-01
- 发明人: Toshiaki Hongo , Tetsu Osawa
- 申请人: Toshiaki Hongo , Tetsu Osawa
- 申请人地址: JP Tokyo
- 专利权人: TOKYO ELECTRON LIMITED
- 当前专利权人: TOKYO ELECTRON LIMITED
- 当前专利权人地址: JP Tokyo
- 优先权: JP2000-085351 20000324
- 主分类号: H05H1/24
- IPC分类号: H05H1/24
摘要:
A plasma processing apparatus can apply a high-quality process to an object to be processed by removing impurities from a gas-introducing part of a process chamber. The gas-introducing part connected to the process chamber so as to introduce a reactant gas into the process chamber. A first vacuum pump is connected to the process chamber so as to evacuate gas from the process chamber so that the process chamber is maintained at a negative pressure. A gas-evacuating arrangement is connected to the gas-introducing part so as to exclusively evacuate the reactant gas from the gas-introducing part. The gas-evacuating arrangement includes a second vacuum pump directly connected to the gas introducing part or a bypass passage connecting the gas-introducing par to the first vacuum pump by bypassing the process chamber.
公开/授权文献
信息查询
IPC分类: