发明申请
US20070254113A1 Plasma processing apparatus having an evacuating arrangement to evacuate gas from gas-introducing part of a process chamber 有权
等离子体处理装置具有从处理室的气体导入部抽出气体的排气装置

  • 专利标题: Plasma processing apparatus having an evacuating arrangement to evacuate gas from gas-introducing part of a process chamber
  • 专利标题(中): 等离子体处理装置具有从处理室的气体导入部抽出气体的排气装置
  • 申请号: US11785356
    申请日: 2007-04-17
  • 公开(公告)号: US20070254113A1
    公开(公告)日: 2007-11-01
  • 发明人: Toshiaki HongoTetsu Osawa
  • 申请人: Toshiaki HongoTetsu Osawa
  • 申请人地址: JP Tokyo
  • 专利权人: TOKYO ELECTRON LIMITED
  • 当前专利权人: TOKYO ELECTRON LIMITED
  • 当前专利权人地址: JP Tokyo
  • 优先权: JP2000-085351 20000324
  • 主分类号: H05H1/24
  • IPC分类号: H05H1/24
Plasma processing apparatus having an evacuating arrangement to evacuate gas from gas-introducing part of a process chamber
摘要:
A plasma processing apparatus can apply a high-quality process to an object to be processed by removing impurities from a gas-introducing part of a process chamber. The gas-introducing part connected to the process chamber so as to introduce a reactant gas into the process chamber. A first vacuum pump is connected to the process chamber so as to evacuate gas from the process chamber so that the process chamber is maintained at a negative pressure. A gas-evacuating arrangement is connected to the gas-introducing part so as to exclusively evacuate the reactant gas from the gas-introducing part. The gas-evacuating arrangement includes a second vacuum pump directly connected to the gas introducing part or a bypass passage connecting the gas-introducing par to the first vacuum pump by bypassing the process chamber.
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