Invention Application
US20070278568A1 High-voltage bipolar-CMOS-DMOS integrated circuit devices and modular methods of forming the same
有权
高压双极CMOS-DMOS集成电路器件和模块化方法相同
- Patent Title: High-voltage bipolar-CMOS-DMOS integrated circuit devices and modular methods of forming the same
- Patent Title (中): 高压双极CMOS-DMOS集成电路器件和模块化方法相同
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Application No.: US11443745Application Date: 2006-05-31
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Publication No.: US20070278568A1Publication Date: 2007-12-06
- Inventor: Richard K. Williams , Donald Ray Disney , Jun-Wei Chen , Wai Tien Chan , HyungSik Ryu
- Applicant: Richard K. Williams , Donald Ray Disney , Jun-Wei Chen , Wai Tien Chan , HyungSik Ryu
- Applicant Address: US CA Sunnyvale CN Hong Kong
- Assignee: Advanced Analogic Technologies, Inc.,Advanced Analogic Technologies (Hong Kong) Limited
- Current Assignee: Advanced Analogic Technologies, Inc.,Advanced Analogic Technologies (Hong Kong) Limited
- Current Assignee Address: US CA Sunnyvale CN Hong Kong
- Main IPC: H01L29/76
- IPC: H01L29/76 ; H01L21/8234

Abstract:
All low-temperature processes are used to fabricate a variety of semiconductor devices in a substrate the does not include an epitaxial layer. The devices include a non-isolated lateral DMOS, a non-isolated extended drain or drifted MOS device, a lateral trench DMOS, an isolated lateral DMOS, JFET and depletion-mode devices, and P-N diode clamps and rectifiers and junction terminations. Since the processes eliminate the need for high temperature processing and employ “as-implanted” dopant profiles, they constitute a modular architecture which allows devices to be added or omitted to the IC without the necessity of altering the processes used to produce the remaining devices.
Public/Granted literature
- US07719054B2 High-voltage lateral DMOS device Public/Granted day:2010-05-18
Information query
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