发明申请
- 专利标题: ASYMMETRY MEASUREMENT APPARATUS
- 专利标题(中): 不对称测量装置
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申请号: US11758006申请日: 2007-06-05
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公开(公告)号: US20070280079A1公开(公告)日: 2007-12-06
- 发明人: Yuh Cheng , Chih-Ching Chen , Chia-Wei Liao , Ming-Jiou Yu , Kuo-Jung Lan , Shu-Hung Chou , Yu-Hsuan Lin
- 申请人: Yuh Cheng , Chih-Ching Chen , Chia-Wei Liao , Ming-Jiou Yu , Kuo-Jung Lan , Shu-Hung Chou , Yu-Hsuan Lin
- 主分类号: G11B20/10
- IPC分类号: G11B20/10
摘要:
An asymmetry measurement apparatus is disclosed. The asymmetry measurement apparatus is designed for detecting the recorded data reproduction waveform of an optical storage device in digital domain. The asymmetry measurement apparatus includes an Analog to Digital Converter (ADC) for converting an analog signal to a digital signal; a detection unit for detecting plurality values of the digital signal; and an asymmetry calculation unit for generating an asymmetry value of the digital signal according to the plurality values.