发明申请
- 专利标题: Error detection and recovery within processing stages of an integrated circuit
- 专利标题(中): 集成电路处理阶段内的错误检测和恢复
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申请号: US11889759申请日: 2007-08-16
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公开(公告)号: US20070288798A1公开(公告)日: 2007-12-13
- 发明人: Krisztian Flautner , Todd Austin , David Blaauw , Trevor Mudge
- 申请人: Krisztian Flautner , Todd Austin , David Blaauw , Trevor Mudge
- 申请人地址: GB Cambridge US MI Ann Arbor
- 专利权人: ARM Limited,University of Michigan
- 当前专利权人: ARM Limited,University of Michigan
- 当前专利权人地址: GB Cambridge US MI Ann Arbor
- 主分类号: H02H3/05
- IPC分类号: H02H3/05
摘要:
An integrated circuit includes a plurality of processing stages each including processing logic 2, a non-delayed latch 4, a delayed latch 8 and a comparator 6. The non-delayed latch 4 captures an output from the processing logic 2 at a non-delayed capture time. At a later delayed capture time, the delayed latch 8 also captures a value from the processing logic 2. The comparator 6 compares these values and if they are not equal this indicates that the non-delayed value was captured too soon and should be replaced by the delayed value. The non-delayed value is passed to the subsequent processing stage immediately following its capture and accordingly error recovery mechanisms are used to suppress the erroneous processing which has occurred by the subsequent processing stages, such as gating the clock and allowing the correct signal values to propagate through the subsequent processing logic before restarting the clock. The operating parameters of the integrated circuit, such as the clock frequency, the operating voltage, the body biased voltage, temperature and the like are adjusted so as to maintain a finite non-zero error rate in a manner that increases overall performance.
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