发明申请
- 专利标题: Variable resistance random access memory device and a method of fabricating the same
- 专利标题(中): 可变电阻随机存取存储器件及其制造方法
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申请号: US11702623申请日: 2007-02-06
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公开(公告)号: US20070295950A1公开(公告)日: 2007-12-27
- 发明人: Choong-Rae Cho , Eun-Hong Lee , Stefanovich Genrikh , El Mostafa Bourim
- 申请人: Choong-Rae Cho , Eun-Hong Lee , Stefanovich Genrikh , El Mostafa Bourim
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 优先权: KR10-2006-0058098 20060627
- 主分类号: H01L47/00
- IPC分类号: H01L47/00 ; H01L21/00
摘要:
Provided is a variable resistance random access memory device having an n+ interfacial layer and a method of fabricating the same. The variable resistance random access memory device may include a lower electrode, an n+ interfacial layer on the lower electrode, a buffer layer on the n+ interfacial layer, an oxide layer on the buffer layer and having a variable resistance characteristic and an upper electrode on the oxide layer.
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