发明申请
US20080006876A1 STACKING FAULT REDUCTION IN EPITAXIALLY GROWN SILICON 有权
封装在外延硅中的故障减少

STACKING FAULT REDUCTION IN EPITAXIALLY GROWN SILICON
摘要:
Methods and a structure are disclosed for providing stacking fault reduced epitaxially grown silicon for use in hybrid surface orientation structures. In one embodiment, a method includes depositing a silicon nitride liner over a silicon oxide liner in an opening, etching to remove the silicon oxide liner and silicon nitride liner on a lower surface of the opening, undercutting the silicon nitride liner adjacent to the lower surface, and epitaxially growing silicon in the opening. The silicon is substantially reduced of stacking faults because of the negative slope created by the undercut.
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