Invention Application
- Patent Title: METHODS FOR NON-INVASIVE ANALYTE MEASUREMENT
- Patent Title (中): 非入侵分析测量方法
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Application No.: US11837146Application Date: 2007-08-10
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Publication No.: US20080009688A1Publication Date: 2008-01-10
- Inventor: Jeffrey Dahlen , William Sell , John Burd , Paul Williams , Gaganbir Johal
- Applicant: Jeffrey Dahlen , William Sell , John Burd , Paul Williams , Gaganbir Johal
- Applicant Address: US CA San Diego
- Assignee: OCULIR, INC.
- Current Assignee: OCULIR, INC.
- Current Assignee Address: US CA San Diego
- Main IPC: A61B5/00
- IPC: A61B5/00

Abstract:
A method of non-invasively measuring the presence, absence, or concentration of one or more analytes in a tissue of a subject includes exposing at least a portion of a tissue of the subject to electromagnetic radiation; obtaining electromagnetic radiation measurement data of electromagnetic radiation from the tissue; using a mathematical transformation to filter or smooth the electromagnetic radiation measurement data; and determining the presence, absence, or concentration of one or more analytes by determining a radiation signature of the filtered or smoothed electromagnetic radiation measurement data; correlating the radiation signature of the filtered or smoothed electromagnetic radiation measurement data with the presence, absence, or concentration of one or more analytes to determine the presence, absence, or concentration of one or more analytes in the subject.
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