发明申请
US20080030386A1 INTEGRATED CIRCUIT, SELF-TEST METHOD FOR THE INTEGRATED CIRCUIT, AND OPTICAL DISC APPARATUS INCLUDING THE INTEGRATED CIRCUIT
失效
集成电路的集成电路，自检电路的自检方法以及包含集成电路的光盘设备
- 专利标题： INTEGRATED CIRCUIT, SELF-TEST METHOD FOR THE INTEGRATED CIRCUIT, AND OPTICAL DISC APPARATUS INCLUDING THE INTEGRATED CIRCUIT
- 专利标题（中）： 集成电路的集成电路，自检电路的自检方法以及包含集成电路的光盘设备
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申请号： US11830705申请日： 2007-07-30
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公开(公告)号： US20080030386A1公开(公告)日： 2008-02-07
- 发明人: Hideyuki Yamakawa , Yukiyasu Tatsuzawa , Takayuki Mori , Takahiro Nango
- 申请人： Hideyuki Yamakawa , Yukiyasu Tatsuzawa , Takayuki Mori , Takahiro Nango
- 申请人地址： JP Tokyo
- 专利权人： Kabushiki Kaisha Toshiba
- 当前专利权人： Kabushiki Kaisha Toshiba
- 当前专利权人地址： JP Tokyo
- 优先权： JP2006-212114 20060803
- 主分类号： H03M1/10
- IPC分类号： H03M1/10
摘要：
An integrated circuit includes an AD converter and a self-test circuit configured to test the AD converter. The self-test circuit includes a clock generator which generates a clock for allowing the AD converter to AD-convert an external sine wave signal externally input, a sine wave generator which generates an internal sine wave signal in digital form, a subtractor which determines a differential signal between the AD-converted external sine wave signal and the internal sine wave signal, a PLL device which allows a phase-locked loop receiving the differential signal as an input to control a phase of the internal sine wave signal such that the internal sine wave signal is in phase with the external sine wave signal, and a root mean square calculator which calculates a root mean square of the differential signal to generate a diagnostic signal corresponding to the AD converter.
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