Invention Application
- Patent Title: Method of calibrating a test chart and a scanning device
- Patent Title (中): 校准测试图和扫描设备的方法
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Application No.: US11882440Application Date: 2007-08-01
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Publication No.: US20080030795A1Publication Date: 2008-02-07
- Inventor: Ming-Hsien Hsieh , Sheng Peng Hsu , Chin Ping Yang
- Applicant: Ming-Hsien Hsieh , Sheng Peng Hsu , Chin Ping Yang
- Assignee: AVISION INC.
- Current Assignee: AVISION INC.
- Priority: TW095128421 20060803
- Main IPC: H04N1/00
- IPC: H04N1/00

Abstract:
A method of calibrating a test chart is provided. First, a reference scanning device scans a reference test chart to obtain a plurality of reference optical density (OD) values. The reference test chart includes a plurality of reference blocks. Then, the reference scanning device scans a test chart to obtain a plurality of first OD values. The test chart includes a plurality of blocks, which corresponds to the reference blocks. Next, a compensation function derived from respectively converting the first OD values into the reference OD values is obtained.
Public/Granted literature
- US07940430B2 Method of calibrating a test chart and a scanning device Public/Granted day:2011-05-10
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