发明申请
US20080038178A1 Method And Device For Producing High Purity Polycrystalline Silicon With A Reduced Dopant Content
有权
用于生产具有降低掺杂剂含量的高纯度多晶硅的方法和装置
- 专利标题: Method And Device For Producing High Purity Polycrystalline Silicon With A Reduced Dopant Content
- 专利标题(中): 用于生产具有降低掺杂剂含量的高纯度多晶硅的方法和装置
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申请号: US11834135申请日: 2007-08-06
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公开(公告)号: US20080038178A1公开(公告)日: 2008-02-14
- 发明人: Thomas Altmann , Hans-Peter Sendlinger , Ivo Crossmann
- 申请人: Thomas Altmann , Hans-Peter Sendlinger , Ivo Crossmann
- 申请人地址: DE Munich
- 专利权人: WACKER CHEMIE AG
- 当前专利权人: WACKER CHEMIE AG
- 当前专利权人地址: DE Munich
- 优先权: DE102006037020.1 20060808
- 主分类号: C01B33/035
- IPC分类号: C01B33/035
摘要:
In the batch production of high purity polycrystalline silicon, in which a U-shaped silicon carrier body is fastened in an open deposition reactor, the deposition reactor is hermetically sealed, the U-shaped carrier body is heated electrical current, a silicon-containing reaction gas and hydrogen are introduced into the reactor through a supply line so that silicon from the reaction gas is deposited on the carrier body, the diameter of the carrier body increases and a waste gas formed is removed from the deposition reactor through a discharge line, and, after a desired diameter of the polysilicon rod is reached, deposition is terminated, the carrier body is cooled to room temperature, the reactor is opened, the carrier body is removed from the reactor and a second U-shaped silicon carrier body made of silicon is fastened in the deposition reactor, an inert gas is fed through the supply and discharge lines into the open reactor from at least the time when the reactor is opened to extract the first carrier body with deposited silicon, until at least the time when the reactor is closed in order to deposit silicon on the second carrier body.
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