Invention Application
- Patent Title: Profiling solid state samples
- Patent Title (中): 分析固态样品
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Application No.: US11503680Application Date: 2006-08-14
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Publication No.: US20080038863A1Publication Date: 2008-02-14
- Inventor: Neal R. Rueger , Mark J. Williamson , Gurtej S. Sandhu , Justin R. Arrington
- Applicant: Neal R. Rueger , Mark J. Williamson , Gurtej S. Sandhu , Justin R. Arrington
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
Methods and apparatus may operate to position a sample, including an imager lens surface, within a processing chamber. Further activities may include creating a layer of reactive material in proximity with the imager lens surface, and exciting a portion of the layer of reactive material in proximity with the imager lens surface to form chemical radicals. Additional activities may include removing a portion of the material in proximity to the excited portion of the imager lens surface to a predetermined level, and continuing the creating, exciting and removing actions until at least one of a plurality of stop criteria occurs.
Public/Granted literature
- US07791071B2 Profiling solid state samples Public/Granted day:2010-09-07
Information query
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