发明申请
- 专利标题: Atomic Force Microscope Using A Torsional Harmonic Cantilever
- 专利标题(中): 原子力显微镜使用扭转谐波悬臂
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申请号: US11877353申请日: 2007-10-23
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公开(公告)号: US20080041143A1公开(公告)日: 2008-02-21
- 发明人: Ozgur Sahin , Calvin Quate , Olav Solgaard
- 申请人: Ozgur Sahin , Calvin Quate , Olav Solgaard
- 申请人地址: US CA Stanford 94305
- 专利权人: The Board of Trustees of the Leland Stanford Junior University
- 当前专利权人: The Board of Trustees of the Leland Stanford Junior University
- 当前专利权人地址: US CA Stanford 94305
- 主分类号: G01B5/28
- IPC分类号: G01B5/28
摘要:
An atomic force microscope based apparatus for examining a sample includes a cantilever having a cantilever arm and a probe tip where the probe tip is offset laterally from a longitudinal axis of torsion of the cantilever arm, an oscillator that drives the cantilever into oscillation in a flexural mode to cause the probe tip to repeatedly interact with the sample where the tip-sample interaction of the laterally offset probe tip excites torsional motion of the cantilever, and a detection system that detects torsional motion of the cantilever in response to the tip-sample interaction.