• 专利标题: COPLANAR SILICON-ON-INSULATOR (SOI) REGIONS OF DIFFERENT CRYSTAL ORIENTATIONS AND METHODS OF MAKING THE SAME
  • 申请号: US11929490
    申请日: 2007-10-30
  • 公开(公告)号: US20080048286A1
    公开(公告)日: 2008-02-28
  • 发明人: Louis HsuJack Mandelman
  • 申请人: Louis HsuJack Mandelman
  • 主分类号: H01L29/00
  • IPC分类号: H01L29/00
COPLANAR SILICON-ON-INSULATOR (SOI) REGIONS OF DIFFERENT CRYSTAL ORIENTATIONS AND METHODS OF MAKING THE SAME
摘要:
In a first aspect, a first method is provided for semiconductor device manufacturing. The first method includes the steps of (1) providing a substrate; and (2) forming a first silicon-on-insulator (SOI) region having a first crystal orientation, a second SOI region having a second crystal orientation and a third SOI region having a third crystal orientation on the substrate. The first, second and third SOI regions are coplanar. Numerous other aspects are provided.
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