发明申请
- 专利标题: Ionization Method and Apparatus for Mass Analysis
- 专利标题(中): 用于质量分析的电离方法和装置
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申请号: US10594837申请日: 2004-03-30
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公开(公告)号: US20080054176A1公开(公告)日: 2008-03-06
- 发明人: Kenzo Hiraoka
- 申请人: Kenzo Hiraoka
- 国际申请: PCT/JP04/04520 WO 20040330
- 主分类号: H01J49/10
- IPC分类号: H01J49/10
摘要:
A laser spray method exhibiting a high detection sensitivity when applied to mass analysis has its sensitivity raised further. In a laser spray method of ionizing a liquid sample by irradiating, with a laser beam, the end of a capillary into which the sample has been introduced, use is made of an infrared laser as the laser beam, at least the end of the capillary is formed of a substance that does not readily absorb the laser beam used, and either the capillary is formed of a conductor and a high voltage is applied thereto, or the capillary is formed of an insulator, a conductive wire is placed inside a small cavity of the capillary and a high voltage is applied to the conductive wire.
公开/授权文献
- US07465920B2 Ionization method and apparatus for mass analysis 公开/授权日:2008-12-16
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