发明申请
- 专利标题: JITTER MEASUREMENT APPARATUS, JITTER MEASUREMENT METHOD, AND RECORDING MEDIUM
- 专利标题(中): 抖动测量装置,抖动测量方法和记录介质
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申请号: US11535279申请日: 2006-09-26
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公开(公告)号: US20080077342A1公开(公告)日: 2008-03-27
- 发明人: Kiyotaka ICHIYAMA , Masahiro Ishida , Takahiro Yamaguchi
- 申请人: Kiyotaka ICHIYAMA , Masahiro Ishida , Takahiro Yamaguchi
- 主分类号: G06F19/00
- IPC分类号: G06F19/00 ; G06F17/40
摘要:
There is provided a jitter measurement apparatus for measuring a jitter of a data signal having a substantially constant data rate. The jitter measurement apparatus includes therein a signal converting section that converts the data signal into a clock signal, where the clock signal retains timings of data transition edges of the data signal at which a data value of the data signal transits and has edges whose cycle is substantially equal to the data rate, an analytic signal generating section that converts the clock signal into an analytic signal of a complex number, and a jitter measuring section that measures the jitter of the data signal based on the analytic signal.
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